Research Article | | Peer-Reviewed

Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity

Received: 10 March 2026     Accepted: 25 March 2026     Published: 13 April 2026
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Abstract

This article examines the behavior of the quadri spectral method in the design of a pyrometer applicable to the heat treatment of metals. The quadri spectral pyrometer incorporates four different optical filters that filter the four spectra to be used and converge them towards the four detectors of the device. The light energy from these spectra will be converted by the detectors into a processable electrical signal. The application of the nonlinear model known as Temperature by Nonlinear Model (TNL) will calculate and select these four wavelengths. This method applies inverse calculus, exploiting Planck's relation for thermal radiation by setting the temperature and then determining the wavelengths using ordinary least squares. With this model, the four wavelengths will be selected sequentially by modeling the emissivity of the metal as a second-degree polynomial. The obtained wavelengths will be subjected to various criteria to choose the best groups for a suitable pyrometer intended for high-temperature metal treatment. Those criteria are flux sensitivity to wavelength and temperature, standard deviation at temperature, and the minimum difference between two successive wavelengths. The various tests against the criteria, given the non-linearity of the emissivity of metals, characterize the model in high temperatures in order to proceed with such a pyrometer design.

Published in Journal of Electrical and Electronic Engineering (Volume 14, Issue 2)
DOI 10.11648/j.jeee.20261402.14
Page(s) 99-109
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2026. Published by Science Publishing Group

Keywords

Multi Spectral Pyrometer, Wavelength, Infrared Radiation, Temperature, Metal

1. Introduction
Temperature measurement remains crucial in industrial life and production across all sectors. One of the most advanced techniques currently available is remote measurement, especially for high temperatures and objects with varying surface shapes. This measurement is based on the radiative properties of the objects whose temperature is being measured and the transformation of this radiation into electronically processable data. Metals are generally known for their nonlinear emissivity. However, several methods offer solutions for designing a pyrometer for remote surface temperature detection. The four-color method with a nonlinear model is the most widely used for pyrometer design, particularly for wavelength selection.
2. Law of Electromagnetic Radiation
2.1. Law of Planck About Thermal Radiation
For a black body at a surface temperature T, the luminance Lλ0(T) is the product of the energy density of the radiation with 4πc. It is the ratio of the luminous intensity or energy density of the radiation to the emission surface .
Lλ0(T)=2hc2λ-5ehckλT-1(1)
where h =6,6255 x 10-34Js: constant of Planck,
k =1,38 x 10-23 JK-1: constant of Boltzmann,
c =2,996 x 108 ms-1: Speed of electromagnetic waves in a vacuum.
By posing C1=2hc2 and C2=hck the so-called Planck constants, The Planck relation becomes :
Lλ0(T)=C1λi-5eC2λiT-1(2)
2.2. Different Regions of the Infrared Spectrum
The infrared range covers wavelengths from 0.8μm to 1000μm . It is generally divided into three sub-ranges: near, mid, and far.
Table 1. Different region of the infrared spectrum.

Near-infrared

Mid Infrared

Far infrared

0.8μm - 2.5μm

2.5μm - 25μm

25μm - 1000μm

2.3. Definition of Spectral Emissivity
Spectral emissivity is defined as the ratio between the monochromatic radiance of the real source and that of a black body at the same wavelengths λ and temperature. It depends primarily on the source, the wavelength, the temperature, and the direction of emission .
ελ=Lλ(T)Lλ0(T)(3)
With - Lλ(T): monochromatic luminance of real source
Lλ0(T): monochromatic radiance a black body
2.4. Spectral Emissivity of Metals
Most surfaces have an emissivity that varies with wavelength and temperature. In the visible and near-infrared spectra, the emissivity of metals can be modeled as a polynomial function of wavelength .
ελ=c0+c1λ+c2λ2+...+cnλn(4)
In our case, we use the second-order polynomial model:
ελ=a++cλ2(5)
For metals with reflective surfaces, they are characterized by a low degree of emission, especially for wavelengths above 4μm, which is non-linear and related to the structure of their surface .
3. Multi-spectral Method Based on Planck's Law
3.1. Principle of Quad Spectral Pyrometer
The radiation from the source is filtered by optical systems which allow the four different spectra to pass through and converge them respectively towards the four identical detection systems .
Figure 2. General principle of quadruspectral pyrometers.
3.2. Presentation of the TNL.Tabc Model
With this method, temperature and emissivity are calculated simultaneously. The TNL.Tabc model stands for Temperature by Nonlinear Emissivity model, where T, a, b, and c are the parameters to be estimated. This model is based on estimating fluxes expressed using Planck's law of radiance. Emissivity is modeled as a second-degree polynomial.
The flux LλT,a,b,c is a function of wavelength and temperature .
LλiT,a,b,c=a+bλi+cλi2C1λi-5expC2λiT-1(6)
With ελi=a+bλi+cλi2 is the spectral emissivity.
The parameter estimation will then be performed by minimizing the function JT,a,b,c.
JT,a,b,c=i=14Lλiexp-LλiT,a,b,c2(7)
With - Lλiexp: Experimental spectral flux measured at wavelength λi,
LλiT,a,b,c: Theoretical spectral flux at wavelength λi.
3.3. Model for the Sequential Wavelength Selection Method
To select the four optimal wavelengths, the cost function will be minimized using the least squares method by inverting the calculation. That is, we set the temperature, and from this temperature, the optimal wavelength that minimizes the standard deviation of the target temperature is retrieved. Combining the cost function with the TNL.Tabc model allows us to find the different wavelengths intended for the pyrometer's optical filter .
The statistical properties of the parameter estimator associated with the TNL.Tabc model and the parameters provided by the least squares method are given by the variance-covariance matrix. The determination of the standard deviations σβ of the parameters T, a, b, and c is based on using this matrix. The approximate expression of the ordinary least squares variance-covariance matrix, given for a parameter vector β=(T, a, b, c), considering the independent, identically distributed additive noise (constant variance σnoise2, and zero mean), is given by the following matrix relation .
covβ=σT2covT,acovT,bcovT,ccovT,aσa2cova,bcova,ccovT,bcova,bσb2covb,ccovT,ccova,ccovb,cσc2
cov(β)=XtX-1σnoise2(8)
The standard deviation on the temperature σT, which is a function of the standard deviation on noise σnoise, is given by the following relationship:
σT=XtX-1σnoise(9)
With X being the sensitivity matrix associated with the variance-covariance matrix. It has the following matrix form:
Lλ1T,a,b,cTLλ1T,a,b,caLλ1T,a,b,cbLλ1T,a,b,ccLλ2T,a,b,cTLλ2T,a,b,caLλ2T,a,b,cbLλ2T,a,b,ccLλ3T,a,b,cTLλ3T,a,b,caLλ3T,a,b,cbLλ3T,a,b,ccLλ4T,a,b,cTLλ4T,a,b,caLλ4T,a,b,cbLλ4T,a,b,cc
From experience with the infrared camera, the σnoise is about 8,97.104Wm-2 that is to say about 7.43.10-3% of the maximum of Planck's law .
3.4. Pseudo-optimal Method for Wavelength Selection
Wavelengths are selected sequentially. Normally, for a given calculation temperature, there will be one optimal wavelength for the first, two for the second, six for the third, and so on, resulting in 24 optimal wavelengths.
In this case, there are 24 groups of four optimal wavelengths that minimize the standard deviation of the temperature at a given calculation temperature. These 24 groups of wavelengths must then be tested against criteria to determine the best group .
In our application, we will try using five calculation temperatures (TC): 1073.15K, 1173.15K, 1223.15K, 1273.15K, and 1373.15K to find several options and temperature ranges.
Selection of the first optimal wavelength
The first wavelength filter λOP1 minimizes the standard deviation σT of the temperature as a monochromatic measurement. Only the temperature is the parameter to be estimated for the cost function Jβ .
JT=Lλ1exp-Lλ1T,a,b,c2(10)
The sensitivity matrix X consists only of the first row and first column. The temperature will be the only parameter.
X=Lλ1T,a,b,cT
Selection of the second optimal wavelengths
The selection of the second wavelength depends on the first one that has just been selected. We fix a=1, b=1, and λ1=λOP1. The function cost consists of only 02 parameters T and a. The model then becomes TNL.Ta.
JT,a=i=12Lλiexp-LλiT,a,b,c2(11)
The sensitivity matrix X is composed of 02 rows and 02 columns.
X=Lλ1T,a,b,cTLλ1T,a,b,caLλ2T,a,b,cTLλ2T,a,b,ca
Selection of the third optimal wavelengths
As with the calculation of the second optimal wavelength, the determination of the third depends on the first and second, i.e. λ1=λOP1and λ2=λOP2. The parameters of the cost function become T, a, and b.
JT,a,b=i=13Lλiexp-LλiT,a,b,c2(12)
The X sensitivity matrix associated with the TNL.Tab model is formed by a matrix with 3 rows and 3 columns.
X=Lλ1T,a,b,cTLλ1T,a,b,caLλ1T,a,b,cbLλ2T,a,b,cTLλ2T,a,b,caLλ2T,a,b,cbLλ3T,a,b,cTLλ3T,a,b,caLλ3T,a,b,cb
Selection of the fourth and last optimal wavelengths
The fourth optimal wavelength will be obtained by using the same principle as the second and third optimal wavelengths, by fixing λ1=λOP1, λ2=λOP2 andλ3=λOP3 .
The parameters of the cost function become T, a, b, and c.
JT,a,b,c=i=14Lλiexp-LλiT,a,b,c2(13)
The X sensitivity matrix associated with the TNL.Tabc model is formed by a matrix of 4 rows and 4 columns.
Lλ1T,a,b,cTLλ1T,a,b,caLλ1T,a,b,cbLλ1T,a,b,ccLλ2T,a,b,cTLλ2T,a,b,caLλ2T,a,b,cbLλ2T,a,b,ccLλ3T,a,b,cTLλ3T,a,b,caLλ3T,a,b,cbLλ3T,a,b,ccLλ4T,a,b,cTLλ4T,a,b,caLλ4T,a,b,cbLλ4T,a,b,cc
4. Results of Criteria for Selecting the Optimal Wavelengths
The groups of optimal wavelengths calculated from the 05 calculation temperatures (TC): 1073.15K, 1173.15K, 1223.15K, 1273.15K and 1373.15K must respect all the different selection criteria.
4.1. Pyrometer Spectral Range Criterion
Our field of study lies in the near-infrared spectral band, between wavelengths of 0.8µm and 2.5µm.
For metals, temperature measurement requires the use of short wavelengths, as metals are known for their low emission at wavelengths above 4µm, in order to avoid unacceptable errors .
Table 2. Pre-selected optimal wavelengths in the near-infrared range.

TC [K]

Channel 1

Channel 2

Channel 3

Channel 4

λOP1 [µm]

σT [K]

λOP2 [µm]

σT [K]

λOP3 [µm]

σT [K]

λOP4 [µm]

σT [K]

1073.15

2.246

0.000959

1.535

0.005373

1.186

0.043606

0.967

0.461628

1.392

0.471311

2.000

0.132117

1.945

0.038898

1.099

0.128315

1.719

0.484844

2.122

0.659303

1173.15

2.054

0.000671

1.403

0.003772

1.085

0.030674

0.884

0.323962

1.273

0.333100

1.896

0.090029

1.778

0.027332

1.005

0.090259

1.572

0.340205

1.939

0.465602

1223.15

1.970

0.000568

1.346

0.003185

1.041

0.025831

0.848

0.272897

1.222

0.279541

1.821

0.075742

1.707

0.023056

0.965

0.075973

1.509

0.287155

1.857

0.392977

1273.15

1.893

0.000684

1.294

0.002712

1

0.022004

0.815

0.232649

1.174

0.238138

1.749

0.064520

1.640

0.019644

0.900

0.065571

1.449

0.244430

1.788

0.334194

1373.15

1.755

0.000357

1.199

0.002005

0.927

0.016302

0.756

0.172321

1.088

0.176781

1.622

0.047746

1.520

0.014494

0.855

0.047922

1.343

0.180200

1.658

0.245986

4.2. Criteria for the Minimum Difference Between Two Successive Wavelengths
The minimum difference between two successive wavelengths must be respected. Measurement errors increase with the spectral variation of the emissivity and the increase in the distance between two successive wavelengths .
Δjiλj-λiTλj2C2λjλiMin(14)
Table 3. Minimum difference between two successive wavelengths .

Successive optimal wavelengths

Minimum difference

Maximal value

First and second

λOP1-λOP2Δ1-2Min

λOP2MaxλOP1-Δ1-2Min

Second and third

λOP2-λOP3Δ2-3Min

λOP3MaxλOP2-Δ2-3Min

Third and forth

λOP3-λOP4Δ3-4Min

λOP4MaxλOP3-Δ3-4Min

Table 4. Optimal wavelength selected according to the criterion of the minimum difference between 02 successive spectra.

TC [K]

λOP [µm]

σT [K]

σT [%]

Δλ [µm]

Δmin [µm]

1073.15

λOP1 = 2.246

0.000959

0.000089

λOP1 - λOP2 = 0.711 λOP2 - λOP3 = 0.349 λOP3 - λOP4 = 0.219

λOP1 - λOP2 = 0.411 λOP2 - λOP3 = 0.192 λOP3 - λOP4 = 0.114

λOP2 = 1.535

0.005373

0.000501

λOP3 = 1.186

0.043606

0.004063

λOP4 = 0.967

0.461628

0.043016

1173.15

λOP1 = 2.054

0.000671

0.000057

λOP1 - λOP2 = 0.651 λOP2 - λOP3 = 0.318 λOP3 - λOP4 = 0.201

λOP1 - λOP2 = 0.344 λOP2 - λOP3 = 0.160 λOP3 - λOP4 = 0.095

λOP2 = 1.403

0.003772

0.000321

λOP3 = 1.085

0.030674

0.002614

λOP4 = 0.884

0.323962

0.027614

1223.15

λOP1 = 1.970

0.000568

0.000046

λOP1 - λOP2 = 0.624 λOP2 - λOP3 = 0.305 λOP3 - λOP4 = 0.193

λOP1 - λOP2 = 0.329 λOP2 - λOP3 = 0.154 λOP3 - λOP4 = 0.092

λOP2 = 1.346

0.003185

0.000260

λOP3 = 1.041

0.025831

0.002112

λOP4 = 0.848

0.272897

0.022311

1273.15

λOP1 = 1.893

0.000684

0.000054

λOP1 - λOP2 = 0.599 λOP2 - λOP3 = 0.294 λOP3 - λOP4 = 0.185

λOP1 - λOP2 = 0.317 λOP2 - λOP3 = 0.148 λOP3 - λOP4 = 0.088

λOP2 = 1.294

0.002712

0.000213

λOP3 = 1.000

0.022004

0.001728

λOP4 = 0.815

0.232649

0.018273

1373.15

λOP1 = 1.755

0.000357

0.000026

λOP1 - λOP2 = 0.556 λOP2 - λOP3 = 0.272 λOP3 - λOP4 = 0.171

λOP1 - λOP2 = 0.293 λOP2 - λOP3 = 0.119 λOP3 - λOP4 = 0.082

λOP2 = 1.199

0.002005

0.000146

λOP3 = 0.927

0.016302

0.001187

λOP4 = 0.756

0.172321

0.012549

4.3. Standard Deviation on the Temperature of the Fluxes Obtained from the Optimal Wavelengths
The standard deviation of the optimal wavelengths must be checked in order to determine the errors at different temperatures.
Table 5. Standard deviation on temperature according to the calculated optimal wavelengths.

TC [K]

λOP [µm]

Temperature for checking the standard deviation of the temperature

975.15K

1073.15K

1173.15K

1223.15K

1273.15K

1373.15K

1473.15K

1073.15

λOP1 = 2.246

0.001459

0.000959

0.000686

0.000595

0.000524

0.000420

0.000349

λOP2 = 1.535

0.003146

0.001559

0.000884

0.000693

0.000555

0.000378

0.000273

λOP3 = 1.186

0.011394

0.004336

0.001977

0.001408

0.001033

0.000600

0.000379

λOP4 = 0.967

0.056348

0.016485

0.006042

0.003911

0.002627

0.001305

0.000719

1173.15

λOP1 = 2.054

0.001582

0.000982

0.000671

0.000571

0.000493

0.000382

0.000310

λOP2 = 1.403

0.004541

0.002068

0.001094

0.000832

0.000648

0.000419

0.000290

λOP3 = 1.085

0.021317

0.007281

0.003035

0.002078

0.001471

0.000801

0.000478

λOP4 = 0.884

0.138194

0.035367

0.011602

0.007152

0.004595

0.002106

0.001084

1223.15

λOP1 = 1.970

0.001674

0.001011

0.000675

0.000568

0.000486

0.000371

0.000296

λOP2 = 1.346

0.005532

0.002417

0.001235

0.000925

0.000711

0.000448

0.000304

λOP3 = 1.041

0.029580

0.009576

0.003817

0.002564

0.001782

0.000940

0.000546

λOP4 = 0.848

0.219035

0.052467

0.016292

0.009805

0.006161

0.002715

0.001351

1273.15

λOP1 = 1.893

0.001789

0.001050

0.000685

0.000571

0.000484

0.000343

0.000286

λOP2 = 1.294

0.006791

0.002847

0.001406

0.001038

0.000786

0.000484

0.000321

λOP3 = 1.000

0.041610

0.012759

0.004862

0.003202

0.002185

0.001116

0.000631

λOP4 = 0.815

0.349686

0.078430

0.023061

0.013551

0.008329

0.003529

0.001697

1373.15

λOP1 = 1.755

0.002101

0.001164

0.000725

0.000592

0.000492

0.000357

0.000274

λOP2 = 1.199

0.010626

0.004095

0.001886

0.001350

0.000995

0.000582

0.000370

λOP3 = 0.927

0.084590

0.023272

0.008105

0.005130

0.003377

0.001616

0.000863

λOP4 = 0.756

0.917752

0.180401

0.047544

0.026628

0.015659

0.006132

0.002754

4.4. Sensitivity of the Flux to Temperature and Wavelength
The model called TNL.Tabc involves taking temperature measurements without fully controlling all influencing factors. However, certain precautions must be taken to minimize temperature measurement error. Our working range lies on the increasing portion of the Planck curve because the reduced sensitivities of the flux to temperature χT and wavelength χλ are all the better when working at shorter wavelengths. The wavelengths obtained should provide better sensitivity to both temperature and wavelength.
χT=1LλTdLλTdT(15)
χλ=1LλTdLλT(16)
Table 6. Sensitivity of the flux from the optimal wavelengths.

TC [K]

λOP [µm]

Temperature for verifying of sensitivity of the flux

975.15K

1073.15K

1173.15K

1223.15K

1273.15K

1373.15K

1473.15K

1073.15

λOP1 = 2.246

0.006773

0.005576

0.004674

0.004304

0.003978

0.003429

0.002990

λOP2 = 1.535

0.009898

0.008140

0.006813

0.006268

0.005786

0.004976

0.004326

λOP3 = 1.186

0.012810

0.010534

0.008815

0.008109

0.007485

0.006435

0.005591

λOP4 = 0.967

0.015711

0.012919

0.010811

0.009945

0.009179

0.007891

0.006856

1173.15

λOP1 = 2.054

0.007402

0.006091

0.005102

0.004697

0.004339

0.003737

0.003255

λOP2 = 1.403

0.010829

0.008905

0.007452

0.006856

0.006328

0.005442

0.004729

λOP3 = 1.085

0.014002

0.115147

0.009635

0.008863

0.008181

0.007033

0.006111

λOP4 = 0.884

0.017186

0.014132

0.011826

0.010879

0.010041

0.008632

0.007500

1223.15

λOP1 = 1.970

0.007716

0.006348

0.005317

0.004894

0.004520

0.003892

0.003389

λOP2 = 1.346

0.011287

0.009282

0.007767

0.007146

0.006596

0.005671

0.004929

λOP3 = 1.041

0.014594

0.012001

0.010042

0.009238

0.008527

0.007330

0.006369

λOP4 = 0.848

0.017916

0.014732

0.012328

0.011341

0.010467

0.008998

0.007818

1273.15

λOP1 = 1.893

0.008029

0.006605

0.005531

0.005090

0.004701

0.004047

0.003522

λOP2 = 1.294

0.011741

0.009655

0.008079

0.007432

0.006861

0.005898

0.005126

λOP3 = 1.000

0.015193

0.012493

0.010454

0.009617

0.008876

0.007631

0.006630

λOP4 = 0.815

0.018641

0.015329

0.012827

0.011800

0.010891

0.009363

0.008135

1373.15

λOP1 = 1.755

0.008658

0.007122

0.005962

0.005486

0.005066

0.004359

0.003792

λOP2 = 1.199

0.012671

0.010420

0.008719

0.008021

0.007403

0.006365

0.005531

λOP3 = 0.927

0.016389

0.013477

0.011277

0.010374

0.009575

0.008231

0.007152

λOP4 = 0.756

0.020096

0.016525

0.013828

0.012721

0.011741

0.010093

0.008769

Table 7. Sensitivity of flux to wavelength on verification temperatures.

TC [K]

λOP [µm]

Temperature for verifying flux of sensitivity to wavelength

975.15K

1073.15K

1173.15K

1223.15K

1273.15K

1373.15K

1473.15K

1073.15

λOP1 = 2.246

708783

438419

215437

118132

28815.5

-129307

-264699

λOP2 = 1.535

3017940

2433730

1949550

1737360

1541990

1194490

894948

λOP3 = 1.186

6295360

5315970

4503650

4147350

3819100

3234490

2729580

λOP4 = 0.967

10640700

9167330

7945180

7409060

6915060

6035040

5274610

1173.15

λOP1 = 2.054

1072800

748273

480169

363010

255370

64539.6

-99164.8

λOP2 = 1.403

3947540

3247910

2667830

2413500

2179270

1762380

1402700

λOP3 = 1.085

7950900

6780620

5809910

5384100

4991770

4292950

3689210

λOP4 = 0.884

13263700

11500700

10038200

9396680

8805530

7752420

6842330

1223.15

λOP1 = 1.970

1273700

920437

628392

500698

383333

175134

-3618.14

λOP2 = 1.346

4446190

3685950

3055540

2779110

2524490

2071220

1680020

λOP3 = 1.041

8840230

7568920

6514380

6051800

5624470

4866320

4210320

λOP4 = 0.848

14664100

12748200

11158900

10461700

9819330

8674880

7685850

1273.15

λOP1 = 1.893

1486270

1103270

786471

647884

520461

294298

99976.3

λOP2 = 1.294

4965930

4143300

3461080

3161900

2886300

2395610

1971990

λOP3 = 1.000

9784980

8407280

7264470

6763160

6301240

5478390

4767390

λOP4 = 0.815

16124000

14049800

12329300

11574500

10879000

9639990

8569220

1373.15

λOP1 = 1.755

1952330

1506060

1136600

974840

826027

561657

334207

λOP2 = 1.199

6114380

5156120

4361330

4012740

3691580

3119630

2625670

λOP3 = 0.927

11811500

10208300

8878370

8294970

7757400

6799760

5972200

λOP4 = 0.756

19255100

16844500

14844900

13967800

13159500

11719500

10475000

5. Discussions About the Calculation Results
5.1. Pyrometer Spectral Range Criterion
Multispectral measurement minimizes error, so choosing short wavelengths provides better temperature accuracy.
We have five calculation temperatures here, and since we are working in the near-infrared spectrum, after applying this criterion, only 15 optimal wavelength groups remain, compared to 24 initially without this criterion .
5.2. Criteria for the Minimum Difference Between Two Successive Wavelengths
A selected optimal wavelength group meets the criterion of minimum distance between two successive optimal wavelengths. Furthermore, the minimum required separation between two wavelengths is proportional to the longer of the two successive wavelengths. It is also observed that all the first optimal wavelengths in each group with the lowest standard deviations do not meet the criterion of minimum separation between two successive wavelengths.
5.3. Standard Deviation on the Temperature from the Temperature Range of the Fluxes Obtained from the Optimal Wavelengths
As the calculation temperature increases up to 1373.15 K, the optimal wavelengths decrease to at least 0.140 µm.
It is also observed that the standard deviation of the temperature improves as the measurement temperature increases. Therefore, temperature errors decrease for measurements at high temperatures.
The standard deviation degrades inversely with wavelength. And this degradation almost doubles if the wavelength exceeds the lower limit of the near-infrared range, especially for the fourth wavelength.
Between 975.15 K and 1473.15 K, the optimal wavelengths selected at TC=1073.15 K have a better standard deviation than those at TC=1373.15 K.
5.4. Sensitivity of the Flux to Temperature and Wavelength
The temperature sensitivity of the flux increases as the wavelength decreases. In the spectral band of our pyrometer, the temperature sensitivity of the flux applied at a given wavelength decreases as the temperature increases.
In the spectral band between 0.8 µm and 2.5 µm, the temperature sensitivity of the flux is significantly better at 975.15 K than at 1473.15 K. Therefore, the lower the temperature being measured, the better the temperature sensitivity of the flux.
The sensitivity of the flux to wavelength increases as the wavelength decreases. Therefore, measurements using wavelength spectra in the near-infrared region are highly recommended. The flux sensitivity to wavelength obtained from higher temperatures is increasingly better than that calculated at the lower limit within the temperature range to be measured. Wavelengths calculated from temperatures below 1273.15 K present a negative value for the flux sensitivity to wavelength at high temperatures.
6. Conclusions
Only the optimal wavelengths calculated from a temperature of 1273.15 K meet all the selection criteria for the four optimal wavelengths for a multispectral pyrometer. Therefore, using the sequential least-squares method for selecting optimal wavelengths in the TNL.Tabc model, it is better to use a temperature above 1273.15 K.
Considering the permeability of the area and criteria such as flux sensitivity to wavelength and temperature, standard deviation at temperature, and the minimum difference between two successive wavelengths, selecting wavelengths from the near-infrared spectrum gives better results for reducing errors, i.e., a low standard deviation. Temperature measurement of metals requires the use of short wavelengths, and the flux sensitivity to temperature is high for measurements at low temperatures.
Abbreviations

TNL

Temperature Nonlinear

Acknowledgments
I express sincere gratitude to the electronic engineering department teams at the Polytechnical High School of Antsirabe at the University of Vakinankaratra, Madagascar. I give thanks to my family and my colleagues for their support during the realization of this article.
Author Contributions
Ratianarivo Paul Ezekel: Conceptualization, Investigation, Methodology, Resources, Writing – original draft, Writing – review & editing
Data Availability Statement
The data is available from the corresponding author upon reasonable request.
Conflicts of Interest
The author declares no conflicts of interest.
References
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[3] TairanFu, MinghaoDuan, JiaqiTang, ConglingShi, Measurements of the directional spectral emissivity based on a radiation heating source with alternating spectral distributions,
[4] G. R. Gathers, Analysis of multiwavelength pyrometry using nonlinear chi-square fits and Monte Carlo methods,
[5] Helcio R. B. Orlande, Olivier Fudym, Denis Maillet, Renato M. Cotta, Thermal Measurements and Inverse Techniques,
[6] Thomas Pierre, Benjamin Rémy, Alain Degiovanni, Microscale temperature measurement by the multispectral and statistic method in the ultraviolet-visible wavelengths,
[7] M. Boivineau, G. Pottlacher, Thermophysical properties of metals at very high temperatures obtained by dynamic heating techniques: recent advances,
[8] A Barlier-Salsi, Stray light correction on array spectroradiometers for optical radiation risk assessment in the workplace,
[9] Simone MATTEÏ, Thermal radiation from opaque materials
[10] Tairan Fu, Jiangfan Liu, Minghao Duan, Anzhou Zong, Temperature measurements using multicolor pyrometry in thermal radiation heating environments,
[11] Christophe Rodiet, Benjamin Rémy, Alain Degiovanni, Franck Demeurie, – Optimisation of wavelengths selection used for the multi-spectral temperature measurement by ordinary least squares method of surfaces exhibiting non-uniform emissivity,
[12] Jian Xing, Shuang Long Cui, Yuan Dong Shi, A Iteration Processing Algorithm for Multi-Wavelength Pyrometer,
[13] V. TankH. Dietl, Multispectral infrared pyrometer for temperature measurement with automatic correction of the influence of emissivity,
[14] George Zonios, Noise and stray light characterization of a compact CCD spectrophotometer used in biomedical applications,
[15] AntónioAraújo, Dual-band pyrometry for emissivity and temperature measurements of gray surfaces at ambient temperature: The effect of pyrometer and background temperature uncertainties,
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  • APA Style

    Ezekel, R. P. (2026). Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity. Journal of Electrical and Electronic Engineering, 14(2), 99-109. https://doi.org/10.11648/j.jeee.20261402.14

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    ACS Style

    Ezekel, R. P. Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity. J. Electr. Electron. Eng. 2026, 14(2), 99-109. doi: 10.11648/j.jeee.20261402.14

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    AMA Style

    Ezekel RP. Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity. J Electr Electron Eng. 2026;14(2):99-109. doi: 10.11648/j.jeee.20261402.14

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  • @article{10.11648/j.jeee.20261402.14,
      author = {Ratianarivo Paul Ezekel},
      title = {Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity},
      journal = {Journal of Electrical and Electronic Engineering},
      volume = {14},
      number = {2},
      pages = {99-109},
      doi = {10.11648/j.jeee.20261402.14},
      url = {https://doi.org/10.11648/j.jeee.20261402.14},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.jeee.20261402.14},
      abstract = {This article examines the behavior of the quadri spectral method in the design of a pyrometer applicable to the heat treatment of metals. The quadri spectral pyrometer incorporates four different optical filters that filter the four spectra to be used and converge them towards the four detectors of the device. The light energy from these spectra will be converted by the detectors into a processable electrical signal. The application of the nonlinear model known as Temperature by Nonlinear Model (TNL) will calculate and select these four wavelengths. This method applies inverse calculus, exploiting Planck's relation for thermal radiation by setting the temperature and then determining the wavelengths using ordinary least squares. With this model, the four wavelengths will be selected sequentially by modeling the emissivity of the metal as a second-degree polynomial. The obtained wavelengths will be subjected to various criteria to choose the best groups for a suitable pyrometer intended for high-temperature metal treatment. Those criteria are flux sensitivity to wavelength and temperature, standard deviation at temperature, and the minimum difference between two successive wavelengths. The various tests against the criteria, given the non-linearity of the emissivity of metals, characterize the model in high temperatures in order to proceed with such a pyrometer design.},
     year = {2026}
    }
    

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  • TY  - JOUR
    T1  - Characteristics of Optimal Wavelengths Selection for High Temperature Quadrispectral Pyrometer in Near-infrared Spectral Range for Metals with Non-linear Emissivity
    AU  - Ratianarivo Paul Ezekel
    Y1  - 2026/04/13
    PY  - 2026
    N1  - https://doi.org/10.11648/j.jeee.20261402.14
    DO  - 10.11648/j.jeee.20261402.14
    T2  - Journal of Electrical and Electronic Engineering
    JF  - Journal of Electrical and Electronic Engineering
    JO  - Journal of Electrical and Electronic Engineering
    SP  - 99
    EP  - 109
    PB  - Science Publishing Group
    SN  - 2329-1605
    UR  - https://doi.org/10.11648/j.jeee.20261402.14
    AB  - This article examines the behavior of the quadri spectral method in the design of a pyrometer applicable to the heat treatment of metals. The quadri spectral pyrometer incorporates four different optical filters that filter the four spectra to be used and converge them towards the four detectors of the device. The light energy from these spectra will be converted by the detectors into a processable electrical signal. The application of the nonlinear model known as Temperature by Nonlinear Model (TNL) will calculate and select these four wavelengths. This method applies inverse calculus, exploiting Planck's relation for thermal radiation by setting the temperature and then determining the wavelengths using ordinary least squares. With this model, the four wavelengths will be selected sequentially by modeling the emissivity of the metal as a second-degree polynomial. The obtained wavelengths will be subjected to various criteria to choose the best groups for a suitable pyrometer intended for high-temperature metal treatment. Those criteria are flux sensitivity to wavelength and temperature, standard deviation at temperature, and the minimum difference between two successive wavelengths. The various tests against the criteria, given the non-linearity of the emissivity of metals, characterize the model in high temperatures in order to proceed with such a pyrometer design.
    VL  - 14
    IS  - 2
    ER  - 

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Author Information
  • Electronic Department, ESP-Antsirabe, Antsirabe, Madagascar

    Biography: Ratianarivo Paul Ezekel is a Teacher at Polytechnical High School of Antsirabe, Vakinankaratra University, Electronic Engineering Department. He completed his PhD in Electronic Divices et Systems Engineering from Antananarivo University in 2018, and his Master of Engineering in Automatic Electronic Systems from Polytechnical High School of Antananarivo in 20010. Recognized for his exceptional contributions, Dr. RATIANARIVO Paul Ezekel has been known as the chef department of electronic engineering.

    Research Fields: Electronic system, Instrumentation, Embedded systems, programmable system

  • Abstract
  • Keywords
  • Document Sections

    1. 1. Introduction
    2. 2. Law of Electromagnetic Radiation
    3. 3. Multi-spectral Method Based on Planck's Law
    4. 4. Results of Criteria for Selecting the Optimal Wavelengths
    5. 5. Discussions About the Calculation Results
    6. 6. Conclusions
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  • Abbreviations
  • Acknowledgments
  • Author Contributions
  • Data Availability Statement
  • Conflicts of Interest
  • References
  • Cite This Article
  • Author Information